Pattern_Recognition_and_Machine_Learning.pdf

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Information Science and Statistics
Series Editors:
M. Jordan
J. Kleinberg
B. Sch¨ lkopf
Information Science and Statistics
Akaike and Kitagawa: The Practice of Time Series Analysis.
Bishop: Pattern Recognition and Machine Learning.
Cowell, Dawid, Lauritzen, and Spiegelhalter: Probabilistic Networks and
Expert Systems.
Doucet, de Freitas, and Gordon: Sequential Monte Carlo Methods in Practice.
Fine: Feedforward Neural Network Methodology.
Hawkins and Olwell: Cumulative Sum Charts and Charting for Quality Improvement.
Jensen: Bayesian Networks and Decision Graphs.
Marchette: Computer Intrusion Detection and Network Monitoring:
A Statistical Viewpoint.
Rubinstein and Kroese: The Cross-Entropy Method: A Unified Approach to
Combinatorial Optimization, Monte Carlo Simulation, and Machine Learning.
Studený: Probabilistic Conditional Independence Structures.
Vapnik: The Nature of Statistical Learning Theory, Second Edition.
Wallace: Statistical and Inductive Inference by Minimum Massage Length.
Christopher M. Bishop
Pattern Recognition and
Machine Learning
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Christopher M. Bishop F.R.Eng.
Assistant Director
Microsoft Research Ltd
Cambridge CB3 0FB, U.K.
cmbishop@microsoft.com
http://research.microsoft.com/ cmbishop
Series Editors
Michael Jordan
Department of Computer
Science and Department
of Statistics
University of California,
Berkeley
Berkeley, CA 94720
USA
Professor Jon Kleinberg
Department of Computer
Science
Cornell University
Ithaca, NY 14853
USA
Bernhard Sch¨ lkopf
Max Planck Institute for
Biological Cybernetics
Spemannstrasse 38
72076 T¨bingen
Germany
Library of Congress Control Number: 2006922522
ISBN-10: 0-387-31073-8
ISBN-13: 978-0387-31073-2
Printed on acid-free paper.
© 2006 Springer Science+Business Media, LLC
All rights reserved. This work may not be translated or copied in whole or in part without the written permission of the publisher
(Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA), except for brief excerpts in connection
with reviews or scholarly analysis. Use in connection with any form of information storage and retrieval, electronic adaptation,
computer software, or by similar or dissimilar methodology now known or hereafter developed is forbidden.
The use in this publication of trade names, trademarks, service marks, and similar terms, even if they are not identified as such,
is not to be taken as an expression of opinion as to whether or not they are subject to proprietary rights.
Printed in Singapore.
(KYO)
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springer.com
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